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CAMI Research to Host Continuity & HiPot Testing Seminar & Training Sessions at WPT Expo, Milwaukee

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Feb 17, 2017

CAMI Research Inc. (Acton, MA) will again host seminar & professional development training sessions at the Wire Processing Technology Expo in Milwaukee, and offer opportunities to win $500 in CableEye® accessories. These sessions will be held on the Tuesday – the EXPO set-up day. As an exhibitor, they will reveal a new self-driven exhibit for visitors to experience CableEye’s ease of use and flexibility, especially regarding automated testing.

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A leader in development of PC-based Cable & Wire Harness Test Systems for over 20 years, CAMI returns to the Expo for the eighth straight year with an expanded booth and more exhibits.

Seminar

"Beyond Continuity & HiPot Measurements": CAMI Research will hold this complimentary, seminar the morning of Tuesday, May 9 at the Wisconsin Center. Space is limited, so early booking is advised. camiresearch.com/Campaigns/wpt-expo.html#Free-Seminar

Location: Wisconsin Center, Room 202A
Date: Tuesday, May 9 2017
Time: 10:30am
Duration: 1 hr
Presenter: Christopher E. Strangio
Topics: Test Documentation; Data Security (operator log-in & privilege levels); Real-time screening for intermittent connections; Automation scripting; Barcode-tracking & archival data-logging; Benefits of High Voltage (HiPot) Testing; Q&A

Each seminar attendee will be eligible to participate in a drawing to win $500 in CableEye accessories.

Training Session

"Improving Reliability of Continuity & HiPot Tests": CAMI Research will hold this professional development training session at a special show rate, the afternoon of Tuesday, May 9 at the Wisconsin Center. Space is limited, so early booking is advised. camiresearch.com/Campaigns/wpt-expo.html#Training

Location: Wisconsin Center, Room 202A
Date: Tuesday, May 9 2017
Time: 1:00pm
Duration: 3 hrs with break
Presenter: Christopher E. Strangio
Topics: Basic Tester Functions; Cable Resistance Limits; Automating Tests; Production Testing for Test Technicians; Data Security (Operator Login and Privilege Levels); Diagnostic Tools; Barcode-Tracking, Archival Data-Logging; Custom Connector Design; High Voltage Test Benefits and Limitations; 4-Wire Kelvin Measurement; Protecting your Tester; Q&A

Each attending trainee will be eligible to participate in a drawing to win $500 in CableEye accessories.

Presenter

Christopher E. Strangio is the President and founder of CAMI Research and holds degrees in Electrical Engineering from Villanova University and MIT. A lecturer at the MIT Lowell Institute for twenty years, and author/presenter of a microprocessors multimedia course for the MIT Center for Advanced Engineer Study, he has been awarded two patents, developed the CableEye PC-based cable & harness test system, and is a senior member of the IEEE.

Exhibit

CAMI returns with an expanded presence in Booth #1909 providing hands-on demonstrations of CableEye® Cable and Harness Test Systems. Visitors will be able to try low voltage and high voltage (HiPot) testers and explore the CableEye interface & reports; multilingual, dynamic, graphic-rich display; real-time screening for intermittent connections; relay control; measuring cable length to within 2ft; simple automation scripting; light-guided assembly; barcode-tracking & archival data-logging; determining wire twist relationships; and precision resistance measurement (4-wire Kelvin), 1mΩ to 15Ω.

Attendees of the exhibit will be eligible to participate in a drawing to win $500 in CableEye accessories.

For further information, please go to camiresearch.com/Campaigns/wpt-expo.html or call +1 (978) 266-2655.

WIN $500 of CableEye Accessories

CAMI Research produces expandable and upgradable diagnostic Cable & Harness Test Systems for assembly, prototyping, production, and QC of standard or custom cables. CableEye® Testers display, and document basic electrical properties such as continuity, resistance, dielectric breakdown, insulation resistance, miswires, and intermittent defects.

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Cami Research Logo
Margaret Bishop
Technical Marketing
+1.978.266.2655

CableEye®

CableEye is an expandable and upgradable diagnostic and Pass/Fail Cable and Harness Test System that’s PC-based. It’s used for assembly, prototyping, production, and QC of standard or custom wire cables and harnesses, and comes in six models ...

Low Voltage: M2U-basic, M2U
For diagnostic and Pass/Fail Testing - Find, display, log, & document: continuity (opens, shorts, miswires), and intermittent connections

Low Voltage: M3U, M3UH
For all of the above plus resistance (contact, isolation, embedded), and diodes (orientation, forward voltage, reverse breakdown).

Low Voltage and High Voltage: HVX, HVX-21
For all of the above plus HiPot (dielectric withstand voltage and insulation resistance).

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